Surface Imaging Systems (SIS) will be renamed Bruker Nano and will operate under its previous management.
Frank Burgaezy, executive vice president of Bruker AXS, said: “The new Bruker high-performance atomic force microscopy (AFM) products range from small bench-top AFM systems, to integrated high-end AFM/optical microscope combinations, all the way to large floor standing instruments for the characterization of 300mm wafers in clean room environments.
The impressive SIS core technology consists of extremely compact AFM/scanning probe microscopy components which can be used easily with many instruments such as optical microscopes or micro-hardness testers. We are very pleased to have SIS join the Bruker group, and further enhance our extensive high-performance materials research and QC product lines.”