Advertise With UsAdvertise on our extensive network of industry websites and newsletters.
Get the PBR newsletterSign up to our free email to get all the latest PBR
news.Bruker AXS, which designs and manufactures analytical X-ray systems for elemental analysis, has acquired Surface Imaging Systems, which develops, manufactures and distributes advanced atomic force/scanning probe microscopy systems for applications in materials research, including semiconductors, data storage, electronic materials, solar cells, polymers and catalysts.
Subscribe to our email newsletter
Surface Imaging Systems (SIS) will be renamed Bruker Nano and will operate under its previous management.
Frank Burgaezy, executive vice president of Bruker AXS, said: “The new Bruker high-performance atomic force microscopy (AFM) products range from small bench-top AFM systems, to integrated high-end AFM/optical microscope combinations, all the way to large floor standing instruments for the characterization of 300mm wafers in clean room environments.
The impressive SIS core technology consists of extremely compact AFM/scanning probe microscopy components which can be used easily with many instruments such as optical microscopes or micro-hardness testers. We are very pleased to have SIS join the Bruker group, and further enhance our extensive high-performance materials research and QC product lines.”