Malvern Panalytical’s new Advanced Material Analysis and Simulation Software (AMASS) suite offers a wealth of key information to characterise your layered structures. Join this live webinar to learn what the new AMASS toolbox for X-ray scattering data from layered structures can offer you.

The suite comprises new comprehensive functionality to display, analyse, simulate and to fit X-ray data from thin-film layered structures. These thin layers can range from near-perfect single crystals (such as III-V semiconductor laser structures) and textured polycrystalline films (such as magnetic oxide layers) to evenly layered amorphous films. The new intuitive graphical user interface (GUI) allows the fast and easy determination of key thin-film parameters, such as mismatch and relaxation, composition and layer thickness, density, roughness and more.

Join this webinar on 8 January from 10:30-11:30 (GMT-5:00) to learn what AMASS offers you for the characterisation of your layered structures and to ask your questions during the live Q+A session.

Click here to register for the event.