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Malvern Panalytical

Particle Size and Shape Analysis, Zeta Potential and NIR-Chemical Imaging.

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Webinar: Elemental Analysis of a Wide Range of Oxides

When daily operations require elemental analysis of a wide range of inorganic / geological samples, it is often cumbersome or not possible to set up and maintain a large number of dedicated calibrations to handle such range.

In these cases, a widely applicable but accurate solution is highly desirable.

In this webinar, Malvern Panalytical demonstrates its unique solution WROXI in combination with Epsilon 4, which is capable of handling a wide range of sample types.

The webinar will take place on 12 October from 10:30 (GMT-10:00) to 11:30.

Speaker Stephen Williams is senior application specialist of x-ray fluorescence (XRF). He will guide anyone interested in elemental analysis by XRF on a variety of materials in particular geological samples to learn about a versatile calibration strategy for a wide range of elements and how it can now be applied to the Epsilon 4 benchtop XRF system

Attendees will also get an overview of the WROXI calibration methodology and see examples of standards run against this calibration on the E4 for validation.

Register for the event here. 

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